Instructors who teach this course:

Upcoming Dates

Are you interested in this course, but it is either not offered or not at a time that works with your schedule?

You will be contacted once this course becomes available.

Course Details

Course Outline
  • Sample preparation for SEM imaging
  • Optimizing microscopes for imaging
  • Imaging at low vacuum
  • Imaging at low accelerating voltages
  • Very high resolution imaging
  • Image analysis and interpretation
Who Should Enroll
  • Students who have attended the Hooke College of Applied Science's Introduction to SEM or equivalent level of experience
Student Learning Resources
  • Detailed course manual
  • JEOL JSM-6480LV low vacuum SEM
  • JEOL JSM-6610LV low vacuum SEM
  • JEOL JSM-IT500HR
  • All instrumentation, materials, and supplies necessary for successful completion of this course will be provided onsite by the Hooke College of Applied Sciences. 
Suggested Prerequisites
  • A Scanning Electron Microscopy course or an equivalent level of experience
Satisfactory Completion Requirements

Students are expected to successfully complete a variety of tasks in the form of hands-on exercises, laboratory exercises, identifications of unknowns, and quizzes. Students are notified at the end of the course whether or not they have successfully completed the requirements of the course based on:

  • 100% attendance
  • class participation
  • completion of all course material
  • completed and signed student evaluation form

Upon successfully meeting these requirements, a student is awarded a certificate of completion and CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or CEU credits.

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