This advanced topics scanning electron microscopy (SEM) course provides instruction and hands-on practice for getting the best possible SEM images, especially from difficult samples or under challenging operating conditions. Signals and image generation, instrument operation, operating variables, image interpretation, and applications of SEM will be studied through lectures and hands-on practice. Advanced SEM imaging topics, such as very high resolution imaging and low voltage imaging, will be covered.
See below for course outline and additional information.
Students who have attended the Hooke College of Applied Science's Introduction to SEM or equivalent level of experience.
Students are expected to successfully complete a variety of tasks in the form of hands-on exercises, laboratory exercises, identifications of unknowns, and quizzes. Students are notified at the end of the course whether or not they have successfully completed the requirements of the course based on:
Upon successfully meeting these requirements, a student is awarded a certificate of completion and CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or CEU credits.