Instructors who teach this course:

Upcoming Dates

Are you interested in this course, but it is either not offered or not at a time that works with your schedule?

You will be contacted once this course becomes available.

Course Details

Course Outline
  • Sample preparation for SEM imaging
  • Optimizing microscopes for imaging
  • Imaging at low vacuum
  • Imaging at low accelerating voltages
  • Very high resolution imaging
  • Image analysis and interpretation
Who Should Enroll
  • Students who have attended the Hooke College of Applied Science's Introduction to SEM or equivalent level of experience
Student Learning Resources
  • Detailed course manual
  • JEOL JSM-6460LV low vacuum SEM
  • JEOL JSM-6480LV low vacuum SEM 
  • JEOL JSM-6610LV low vacuum SEM
  • All instrumentation, materials, and supplies necessary for successful completion of this course will be provided onsite by the Hooke College of Applied Sciences. If you wish to participate in the pre- and post-course online web activities associated with this course you must have access to a computer and the internet
Suggested Prerequisites
  • A Scanning Electron Microscopy course or an equivalent level of experience
Satisfactory Completion Requirements

Students are expected to successfully complete a variety of tasks in the form of hands-on exercises, laboratory exercises, identifications of unknowns, and quizzes. Students are notified at the end of the course whether or not they have successfully completed the requirements of the course based on:

  • 100% attendance
  • class participation
  • completion of all course material
  • completed and signed student evaluation form

Upon successfully meeting these requirements, a student is awarded a certificate of completion and CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or CEU credits.

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