This overview of AFM/SPM is a practical, hands-on course to teach the principles of operation, basic and advanced imaging modes, and overall capabilities of atomic force microscopy/scanning probe microscopy. In lectures interwoven with labs on a variety of samples, students will learn, understand, and operate state-of-the-art microscopes.
This AFM/SPM course provides a foundation for students in the operation of atomic force microscopes to understand (and be able to select appropriately) the various modes and how best to operate the microscope by understanding the operating principles. At the end of the course, students will be able to set up an imaging experiment and run basic static and dynamic AFM modes. They will also gain an understanding of the various imaging parameters involved and how to optimize the parameters for best imaging results. Some advanced topics such as advanced imaging modes and simulation capabilities are also covered to provide students with a comprehensive background to the field. Finally, students will learn the various image processing tools available to properly analyze and interpret their images.
See below for course outline and additional information.
Enjoy the Atomic Force Microscopy for Polymer Characterization and Analysis presentation from our library of free Resources On-Demand Webinars.
Upon satisfactory completion of this course students are able to:
This course is intended for students new to atomic force microscopy/scanning probe microscopy or for experienced users who desire additional training. The audience is broad and includes both academic and industrial scientists and engineers from advanced undergraduates to seasoned professionals who are interested in learning about AFM and how it can improve their R&D efforts.
Instrument operators, lab facility managers, materials scientists, technicians, advanced undergraduates or graduate students
Based on availablity students will use:
Optional Recommended Text:
Scanning Probe Microscopy in Industrial Applications, edited by Dalia Yablon, Wiley . $133
Freshman physics background is assumed.
No prior use of AFM/SPM is required.
Students are expected to successfully complete a variety of tasks in the form of hands-on exercises, laboratory exercises, identifications of unknowns, and quizzes. Students are notified at the end of the course whether or not they have successfully completed the requirements of the course based on:
Upon successfully meeting these requirements, a student is awarded a certificate of completion and CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or CEU credits.