Scanning Electron Microscopy, Online Course

Course Details

Students with no prior experience will learn to align an SEM, obtain secondary electron (SE) and backscatter electron (BE) micrographs, and perform EDS qualitative and quantitative analysis. For students with prior experience, instructors Craig S. Schwandt, Ph.D., and Douglas C. Meier, Ph.D. emphasize techniques to identify particles and optimize SEM and EDS analysis for a wide range of materials analysis problems.

During this online, on-demand scanning electron microscopy course, you’ll learn:

  • Instrument Basics
    • Vacuum
    • Emitter
    • Column
    • Detectors
  • Image Acquisition
    • Alignment
    • Parameters
  • Quantitative Mapping
  • Quantitative Analysis



Accredited as an Authorized Provider by the International Association for Continuing Education and Training (IACET), an internationally recognized organization for standards and authorization for continuing education and training, Hooke College of Applied Sciences provides a research-based learning experience taught by some of the best experts in the industry.

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