Students with no prior experience will learn to align an SEM, obtain secondary electron (SE) and backscatter electron (BE) micrographs, and perform EDS qualitative and quantitative analysis. For students with prior experience, instructors Craig S. Schwandt, Ph.D., and Douglas C. Meier, Ph.D. emphasize techniques to identify particles and optimize SEM and EDS analysis for a wide range of materials analysis problems.
During this online, on-demand scanning electron microscopy course, you’ll learn:
- Instrument Basics
- Image Acquisition
- Quantitative Mapping
- Quantitative Analysis