During this 2-day, hands-on Scanning Electron Microscopy (SEM) workshop, you will use JEOL JCM-7000 benchtop SEMs with EDS to learn the fundamentals of SEM analysis, including setup and operation of the instrument.
You’ll learn how to:
- Operate an SEM and learn the fundamentals of scanning electron microscopy
- Obtain secondary electron (SE) and backscatter electron (BE) micrographs
- Perform qualitative and quantitative analysis
- If you already have some experience operating an SEM, the instructor will emphasize techniques to further help you identify particles and solve practical problems
Students are invited to bring their own samples to be analyzed in this lab workshop.
The $2000 course fee includes the $795 online module and the 2-day hands-on workshop at Lewis University.
For details and registration, phone 630-887-7100 or complete our contact form.