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Scanning Electron Microscopy Workshop, Lewis University Campus

Course Details

During this 1.5-day, hands-on Scanning Electron Microscopy (SEM) workshop, you will use JEOL JCM-7000 benchtop SEMs with EDS to learn the fundamentals of SEM analysis, including setup and operation of the instrument.

You’ll learn how to:

    • Operate an SEM and learn the fundamentals of scanning electron microscopy
    • Obtain secondary electron (SE) and backscatter electron (BE) micrographs
    • Perform qualitative and quantitative analysis
      • If you already have some experience operating an SEM, the instructor will emphasize techniques to further help you identify particles and solve practical problems

Students are invited to bring their own samples to be analyzed in this lab workshop.

 

Details and Registration

Accreditations

Accredited as an Authorized Provider by the International Association for Continuing Education and Training (IACET), an internationally recognized organization for standards and authorization for continuing education and training, Hooke College of Applied Sciences provides a research-based learning experience taught by some of the best experts in the industry.

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