Scanning Electron Microscopy

Course Details


The Scanning Electron Microscopy (SEM) training course emphasizes hands-on learning, using the latest SEM and EMA instruments. Students have the opportunity to study their own samples, or test samples provided by our experienced instructors.

During the scanning electron microscopy course, students learn through lecture, demonstration, and hands-on participation how to setup and operate SEM and EDS instruments, including low-vacuum and field-emission models. This SEM training provides a foundation for students new to SEM and EDS. At the end of the SEM workshop, students with no prior experience are able to align an SEM, obtain secondary electron (SE) and backscatter electron (BE) micrographs, and perform EDS qualitative and quantitative analysis. For students with prior experience, instructors emphasize techniques to identify particles and solve practical problems. The experience of our instructors helps students optimize SEM and EDS analysis for a wide range of materials analysis problems.

This course is part of our Industrial Microscopy Specialization.

We also offer advanced SEM courses in EDS and imaging.

  • Introduction and discussion of course and instrumentation
  • Discussion of student’s interest
  • Lecture on comparison of types of scanning electron microscopes
  • Lecture and practice on beam/specimen interaction, image formation, and image processing
  • Demonstration of scanning electron microscopes
  • Demonstration of and student participation in sample preparation, techniques, and equipment
  • Scanning electron microscopy lab exercises in imaging instrument setup and operation
  • Lecture and demonstrations on X-Ray analysis theory and detection, qualitative and quantitative EDS, and linescans and mapping
  • Practice and participation of students on real-world samples

All instrumentation, materials, and supplies necessary for successful completion of this course will
be provided onsite by Hooke College of Applied Sciences.

  • Detailed course manual
  • JEOL JSM-6480LV low vacuum SEM
  • JEOL JSM-6610LV low vacuum SEM 
  • JEOL JSM-IT500HR
  • JEOL JCM-7000 NeoScope
  • Given SEM instrumentation setup and operation, as well as techniques in SEM sample preparation, capturing secondary and backscatter micrographs, and EDS qualitative and quantitative analysis, the student will set/up and operate a SEM, prepare materials for imaging and analysis, conduct analysis and interpretation, accomplishing all tasks successfully
  • Given SEM (including low-vacuum and field-emission models), and EDS instruments, the student will setup (align) and operate the instruments successfully
  • Given SEM sample preparation techniques and equipment, the student will mount samples appropriately for imaging and analysis
  • Given SEM instrumentation, the student will acquire techniques in obtaining secondary electron and backscatter electron micrographs
  • Given SEM and EDS instrumentation, the student will perform EDS qualitative and quantitative analysis
  • Students new to SEM and EDS
  • Students who would like to improve practical use and techniques
  • Electron microscopists
  • Materials scientists
  • Technicians
  • Instrument operators

“It was great to have three instructors for eight students… The small class size was great!” Centre of Forensic Sciences

“Instructors know the student’s level of expertise and were willing to stay past normal lecture hours. The review of certain materials was very helpful and the classroom environment was very relaxed.” New York City EPA

“The hands-on work was great. I liked having three instructors, each with unique experience.” Maryland State Police

“Because class sizes are kept small, it allows students to experience more hands-on time with the equipment and provides direct access to the instructors, who are extremely well-versed in their subject area. This combination makes it possible to successfully train students in complex subjects in a very short time.” Imperial Oil

  • Prior use of SEM with EDS
  • Initial in-house or vendor training

Students are expected to successfully complete a variety of tasks in the form of hands-on exercises, laboratory exercises, identifications of unknowns, and quizzes. In addition, students are required to have 100% attendance during the course, participate in class, complete a student evaluation form and pre- and post-course assessment forms.

The student is notified at the end of the course whether or not they have successfully completed the requirements of the course based on:

  • 100% Attendance
  • Class participation
  • Completion of all course material
  • Completed and signed student evaluation form

Upon successfully meeting these requirements, a student is awarded a certificate of completion and 3 CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or 3 CEU credits.

This course is part of the Industrial Microscopy Specialization program.

The program consists of attending four standard Hooke College of Applied Sciences courses with hands-on instruction and a 40 hour practicum study characterizing unknown samples.

  1. Polarized Light Microscopy
  2. Introduction to Scanning Electron Microscopy
  3. Sample Preparation: Particle Isolation and Handling Techniques
  4. FTIR Training

After finishing the four courses, students complete a Capstone Project that requires students to characterize and identify samples by integrating all of the skills learned during the four courses taken for the program. Those students who successfully complete the four courses and associated practicums and a Capstone Project earn an Industrial Microscopy Specialization.

Please see our General Policies page for information related to course registration and cancellation.

Upcoming Dates


December 2, 2019 - December 6, 2019
$2195 | 3 credits
M - TH | 8am - 5pm F | 8am - 12pm
Instructors: Douglas C. Meier, Ph.D.; Craig S. Schwandt, Ph.D.; Debra L. Joslin, Ph.D.; Mark (Mak) A. Koten, Ph. D.; Joseph R. Swider, Ph.D.
REGISTER
March 9, 2020 - March 13, 2020
$2195 | 3 credits
M - TH | 8am - 5pm F | 8am - 12pm
Instructors: Craig S. Schwandt, Ph.D.; Debra L. Joslin, Ph.D.; Douglas C. Meier, Ph.D.; Mark (Mak) A. Koten, Ph. D.
REGISTER
July 13, 2020 - July 17, 2020
$2195 | 3 credits
M - TH | 8am - 5pm F | 8am - 12pm
Instructors: Douglas C. Meier, Ph.D.; Debra L. Joslin, Ph.D.; Craig S. Schwandt, Ph.D.; Mark (Mak) A. Koten, Ph. D.; Joseph R. Swider, Ph.D.
REGISTER
October 5, 2020 - October 9, 2020
$2195 | 3 credits
M - TH | 8am - 5pm F | 8am - 12pm
Instructors: Douglas C. Meier, Ph.D.; Craig S. Schwandt, Ph.D.; Debra L. Joslin, Ph.D.; Mark (Mak) A. Koten, Ph. D.; Joseph R. Swider, Ph.D.
REGISTER
December 7, 2020 - December 11, 2020
$2195 | 3 credits
M - TH | 8am - 5pm F | 8am - 12pm
Instructors: Douglas C. Meier, Ph.D.; Craig S. Schwandt, Ph.D.; Debra L. Joslin, Ph.D.; Mark (Mak) A. Koten, Ph. D.; Joseph R. Swider, Ph.D.
REGISTER

Speak to an Admissions Representative

Our representatives are here to answer any questions you have about a course or program at Hooke College.

Welcome to Hooke College

Accredited as an Authorized Provider by the International Association for Continuing Education and Training (IACET), Hooke College of Applied Sciences provides a research-based, hands-on learning experience taught by some of the best experts in the industry. From continuing education to custom courses to professional development and undergraduate programs, Hooke College will allow you to gain the skills you need.