Scanning Electron Microscopy: Advanced X-ray Microanalysis By EDS
This is an advanced Scanning Electron Microscopy (SEM) course in x-ray microanalysis using energy-dispersive x-ray spectrometry (EDS). The prerequisite is successful completion of a SEM training or an equivalent level of experience. The SEM workshop will provide instruction and hands-on practice on performing EDS, analyzing difficult samples, mapping, and interpreting analysis results.
- Brief review of the theory of X-ray generation
- Optimizing X-ray detection
- Qualitative X-ray strategies for difficult samples
- Performing matrix correction and quantitative analysis
- Elemental line profiling and spectral imaging
- Interpreting EDS data
Upon satisfactory completion of this course the student will be able to:
- Prepare samples for X-ray analysis
- Employ best practices for X-ray analysis
- Perform analysis at low vacuum
- Achieve mapping and spectral imaging
- Interpret data
None. This course is designed as a basic introduction to microscopy and trace evidence analysis.
All instrumentation, materials, and supplies necessary for successful completion of this course will be provided onsite by Hooke College of Applied Sciences.
- Detailed course manual
- JEOL JSM-6480LV low vacuum SEM
- JEOL JSM-6610LV low vacuum SEM
- JEOL JSM-IT500HR
Students are expected to successfully complete a variety of tasks in the form of hands-on exercises, laboratory exercises, identifications of unknowns, and quizzes. Students are notified at the end of the course whether or not they have successfully completed the requirements of the course based on:
- 100% Attendance
- Class participation
- Completion of all course material
- Completed and signed student evaluation form
Upon successfully meeting these requirements, a student is awarded a certificate of completion and CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or CEU credits.