The Gunshot Residue analysis by SEM/EDS course emphasizes hands-on learning. Using two SEM instruments, students have the opportunity to study test samples provided by our staff, under the direction of McCrone scientists with over 15 years of combined SEM/EDS Gunshot Residue analysis experience.
During the course, students learn through lecture, demonstration, and hands-on participation: theory of the SEM and EDS systems, how to setup and operate SEM and EDS instruments for GSR analysis. The students will be introduced to and participate in discussions of the ASTM E-1588 and SWGGSR guidelines for SEM/GSR analysis, interpretation of data, reporting conclusions, preparing for expert witness testimony. Students will set up overnight GSR analysis runs using either the JEOL JSM 6480LV SEM with Oxford Instruments INCA EDS system or the ASPEX 3025 SEM/EDS system. This course provides a foundation for students new to SEM and EDS. At the end of the GSR course, students with no prior experience are able to align an SEM, obtain secondary electron (SE) and backscatter electron (BE) micrographs, and perform EDS qualitative and quantitative analysis. For students with prior experience, we emphasize procedures and strategies to optimize the GSR analysis and data reduction.
See below for course outline and additional information.
This practical SEM course provides a core foundation for students new to SEM/EDS GSR analysis or for those who would like to improve practical use and techniques
Students are expected to successfully complete a variety of tasks in the form of hands-on exercises, laboratory exercises, identifications of unknowns, and quizzes. Students are notified at the end of the course whether or not they have successfully completed the requirements of the course based on:
Upon successfully meeting these requirements, a student is awarded a certificate of completion and CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or CEU credits.