The perfect complement to light microscopy, the JEOL JCM-6000Plus benchtop SEM gives you the power of scanning electron microscopy in a convenient, compact package.
View samples and capture images at a magnification range of 10X to 60,000X without adjusting or changing lenses. Improve your analysis and imaging with higher resolution, greater depth of field, longer working distances and better surface sensitivity. Add the optional EDS system to gain elemental analysis.
The new high-sensitivity solid state backscatter electron detector provides composition and topographic imaging information, and shadow modes (a combination of composition and topographic information). Secondary electron imaging and backscattered electron imaging is supported at high vacuum.
For more than 50 years, McCrone Microscopes & Accessories has remained the industry expert. Let us power up your benchtop to give you remarkable images of protein structures, nano particles and stress fractures.
The JCM-6000Plus is fit for every lab.
As we celebrate our 60th anniversary, we thank you for entrusting us with more than 60,000 of your materials analysis projects.
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