Manufacturing defects caused by particles and thin films often cause performance deficiencies. Our staff scientists use state-of-the-art instruments for specialized microscopy and micro-analysis. Ask us for a confidential evaluation of your problem, followed by reliable analysis and consultation. If needed, we offer onsite investigation and coordination of additional services.
Essentials of Polarized Light Microscopy and Ancillary Techniques by John Gustav Delly has been published.
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