McCrone Associate's senior research scientist, Craig Schwandt using the FESEM.
Glass Delamination Process Elucidated through Transmission Electron Microscopy
Westmont, IL (August 1, 2012) – Craig Schwandt and Elaine Schumacher, senior research scientists at McCrone Associates, Inc., will be presenting on new microscopy applications at this year’s annual Microscopy & Microanalysis meeting in Phoenix. Both presentations will use examples to discuss the advantages of using these techniques.
TEM for characterizing glass delamination flakes
Schumacher’s presentation, titled “Transmission Electron Microscopy for Characterization of Vial Glass Delamination Flakes,” will discuss why TEM is an ideal technique to use for identifying and differentiating thin glass delamination flakes from residues isolated from liquid pharmaceutical products.
TEM provides a new level of information about morphology, crystallinity and elemental composition, with extremely high resolution. Schumacher will present several examples that illustrate the value of TEM for analysis of glass delamination materials, and its potential to aid in understanding the delamination process.
A new approach to nanoscopy
Schwandt’s presentation will address how nanoscopy, nanometer-scale element mapping, and nanoanalysis can be used to their full potential when interpreted using a new paradigm. Because homogeneous standard reference materials at the nanometer scale are unavailable, full quantification is not possible. Thus, meaningful data interpretation requires a new approach.
The latest generation of field emission scanning electron microscopes (FESEM) can produce digital images with resolutions down to a single nanometer. However, the mathematical algorithms used to quantitate the composition of materials were designed for analysis of much larger sample volumes. Therefore, until appropriate standards and quantitation algorithms for the appropriate size range are available, alternative methods of interpretation must be used.
In his presentation, Schwandt will discuss an alternative method and demonstrate examples showing how using element mapping with general knowledge of the material sample can create an internally consistent calibration.
“The proper characterization of new ‘nanomaterials’ is important to correctly understanding the materials in terms of their composition, reactivity, mechanical properties, environmental, and biological interaction at the nanometer scale,” said Schwandt.
M&M will be held July 29 – August 2, 2012 at the Phoenix Convention Center. Schumacher will present on Wednesday, August 1 at 11:30 a.m. and Schwandt will present Thursday August 2 at 4:15 p.m.