21 CFR Part 11 Advancements in PAX-it! Imaging Software

December 22, 2016

Presenters: Jim Bristol, McCrone Microscopes & Accessories, and
Adam Babarik, Midwest Information Systems

Ever experience problems with adhesion, printing, passivation, delamination, or other issues with surfaces of products? Any time surfaces interact with other surfaces, or the environment, much of the interesting chemistry occurs in the outermost few atomic layers. Such thin layers can be difficult to analyze with common methods such as SEM, EDS, XRF, IR, chromatography, and bulk analysis techniques, but XPS is an electron spectroscopy method well-suited for these types of problems. The case studies presented show how XPS may be used to investigate surface performance issues of industrial processes. 30 minutes.






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