Atomic Force Microscopy: Six Must-Know Measurements

August 6, 2018

Presenter: Dalia Yablon, Ph.D., Owner, SurfaceChar

Since its invention 30 years ago, the field of AFM has proliferated into dozens of techniques comprising an alphabet soup of three- or four-letter acronyms, but there is still a core group of techniques that are the most popular methods to measure key fundamental properties such as topography, modulus, adhesion, magnetic interactions, and electrical interactions. Dalia discusses six of the common AFM methods used today to explore important surface properties on the nanoscale.

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