Introducing the Latest Advancement in Benchtop SEM Technology – the JEOL JCM-7000

We are excited to announce the release of the 4th generation Neoscope, the JCM-7000. Equipped with a large sample chamber, high and low vacuum modes of operation, both secondary and backscatter electron detectors, real-time 3D imaging, easy to use metrology tools, and optional fully-integrated energy dispersive X-ray (EDS) with real-time live analysis, the JCM-7000 NeoScope is smart, flexible, and powerful. Some of the exciting, new features are:

• High resolution tungsten filament source providing a magnification range of 10X to 100,000X with large depth of field
• Large sample chamber allows for samples 80 mm in diameter by 50 mm tall
• New Zeromag stage navigation system simplifies navigation and enhances production by providing a seamless transition from a color optical image to a live SEM image automatically
• Set up large area automated image montage and stitching, and with the EDS option you can produce automated montage X-ray maps

When you opt for the EDS option, the JCM-7000 includes JEOL’s fully-embedded EDS system with real-time EDS spectra during image observation. With live elemental analysis, you can:

• View EDS spectra in real time as you search for an area of interest
• Set analysis points, area, map positions, and line scans
• View major elements detected, and automatically display on live EDS window

View all of the exciting features, and please send us your samples! We will be happy to schedule a demonstration and show you everything the JCM-7000 can do!