Introducing the Latest Advancement in Benchtop SEM Technology – the JEOL JCM-7000

JEOL JCM-7000 benchtop SEM

We are excited to announce the release of the 4th generation Neoscope, the JCM-7000. Equipped with a large sample chamber, high and low vacuum modes of operation, both secondary and backscatter electron detectors, real-time 3D imaging, easy to use metrology tools, and optional fully-integrated energy dispersive X-ray (EDS) with real-time live analysis, the JCM-7000 NeoScope is smart, flexible, and powerful. Some of the exciting, new features are:

  • High resolution tungsten filament source providing a magnification range of 10X to 100,000X with large depth of field
  • Large sample chamber allows for samples 80 mm in diameter by 50 mm tall
  • New Zeromag stage navigation system simplifies navigation and enhances production by providing a seamless transition from a color optical image to a live SEM image automatically
  • Set up large area automated image montage and stitching, and with the EDS option you can produce automated montage X-ray maps
JEOL JCM-7000 benchtop SEM Zeromag
The JCM-7000 has an intuitive interface.

When you opt for the EDS option, the JCM-7000 includes JEOL’s fully-embedded EDS system with real-time EDS spectra during image observation. With live elemental analysis, you can:

  • View EDS spectra in real time as you search for an area of interest
  • Set analysis points, area, map positions, and line scans
  • View major elements detected, and automatically display on live EDS window
Live 3D imaging is a standard feature.

View all of the exciting features, and please send us your samples! We will be happy to schedule a demonstration and show you everything the JCM-7000 can do!


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