Can Machine Learning Play a Role in Atomic Force Microscopy?
March 5, 2020
Presenter: Dalia Yablon, Ph.D., Founder, SurfaceChar, LLC
You read about machine learning (ML) everywhere—a subset of artificial intelligence—and it has certainly contributed to many areas of research, especially drug and material design. But what about in the characterization area? This webinar will explore the avenues in which machine learning can improve operation and analysis in atomic force microscopy (AFM). We begin with a brief overview of what ML is, then explore three application areas involving specifically AFM: image recognition, particle analysis and autonomous operation.