McCrone Partners With Hitachi High-Tech America to Offer Tabletop SEMs and More

For more than 70 years, McCrone Microscopes & Accessories (MMA) has supplied microscopes and laboratory equipment to scientists around the world. We are excited to announce our partnership with Hitachi High-Tech America, Inc. to distribute Hitachi tabletop scanning electron microscopes (SEMs), the FlexSEM 1000 II, and Hitachi ion milling systems.

Scanning electron microscopes (SEMs) produce high-resolution, high-magnification images by scanning the surface of a specimen with a focused beam of electrons. While traditional SEMs often required dedicated laboratory spaces with vibration isolation and environmental controls, today’s systems have become more compact, accessible, and easier to operate without sacrificing imaging performance.

Introduced more than 20 years ago, tabletop SEMs have advanced significantly in both capability and ease of use. Modern instruments offer magnifications exceeding 100,000×, multiple accelerating voltages, and both secondary electron (SE) and backscattered electron (BSE) detectors. Their compact footprint eliminates the need for specialized laboratory space, and operators can often be trained in less than 30 minutes. As a result, tabletop SEMs are now widely used in industrial, research, and educational laboratories for applications in materials science, biology, forensics, quality control, and failure analysis.

MMA is proud to offer Hitachi’s innovative SEM and ion milling solutions, including the following:

Hitachi TM4000 Plus III Tabletop SEM: The TM4000 Plus III combines ease of use, optimized imaging, and outstanding image quality in a compact tabletop design. Equipped with both a high-sensitivity low-vacuum secondary electron detector and a high-sensitivity four-segment backscattered electron detector, it delivers exceptional versatility for a wide range of applications. Available accelerating voltages of 5, 10, 15, and 20 kV provide flexibility for diverse sample types. Pair the system with an industry-leading Oxford Instruments energy-dispersive X-ray spectroscopy (EDS) detector to add elemental analysis capabilities and take your materials characterization to the next level.

Hitachi FlexSEM 1000 II VP-SEM: The FlexSEM 1000 II VP-SEM combines innovative features with an intuitive interface to deliver the flexibility of a full-sized SEM in a laboratory-friendly footprint. Variable-pressure operation, typically found only on larger instruments, enables exceptional imaging performance across a wide range of specimens. With magnifications from 6X to 300,000X, variable accelerating voltages from 0.3 to 20 kV, and advanced automation, the FlexSEM 1000 II is ideal for applications ranging from biological samples to advanced materials research.

Hitachi IM4000II Ion Milling System: The Hitachi IM4000II Ion Milling System enhances SEM sample preparation by producing artifact-free cross sections and flat surfaces with minimal mechanical damage. Its contact-free ion milling process eliminates stresses introduced by conventional preparation methods while delivering high milling rates for efficient sample preparation. The system is capable of preparing a broad range of materials, from delicate polymers to hard semiconductors, making it an invaluable complement to SEM analysis.

Whether you’re expanding your laboratory’s analytical capabilities or introducing electron microscopy into your workflow, MMA can help you find the right solution. Schedule an online or in-person demonstration to see these instruments in action, have your own samples analyzed, and discuss your application with one of our experienced microscopy specialists.

Discover how Hitachi SEMs and ion milling systems can enhance your laboratory’s productivity and analytical capabilities. The trusted advisors at McCrone Microscopes & Accessories are ready to help you identify the right solution for your needs—contact us today.