WEBINAR: Meet the JEOL JCM-7000 NeoScope Benchtop SEM

February 26, 2020

Presenter: Glenn Miller,  Technical Sales Representative, McCrone Microscopes & Accessories

The JCM-7000, released in March of 2019, is JEOL’s fourth-generation benchtop scanning electron microscope. JEOL has continued to make exciting improvements to their benchtop SEM line; this Neoscope is distinctly different. With a magnification up to 100,000X, resolutions down to 8 nm and a larger EDS detector, and new features like live EDS, live X-ray mapping and live 3-D, this instrument can perform a multitude of tasks. If you are a pharmaceutical scientist, QA manager, or research scientist, see how the new features of the JCM-7000 can advance the analysis of the samples that you work with.

Register today for this free webinar.

 

JEOL JCM-7000 benchtop SEM






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