WEBINAR: Meet the JEOL JCM-7000 NeoScope Benchtop SEM
February 26, 2020
Presenter: Glenn Miller, Technical Sales Representative, McCrone Microscopes & Accessories
The JCM-7000, released in March of 2019, is JEOL’s fourth-generation benchtop scanning electron microscope. JEOL has continued to make exciting improvements to their benchtop SEM line; this Neoscope is distinctly different. With a magnification up to 100,000X, resolutions down to 8 nm and a larger EDS detector, and new features like live EDS, live X-ray mapping and live 3-D, this instrument can perform a multitude of tasks. If you are a pharmaceutical scientist, QA manager, or research scientist, see how the new features of the JCM-7000 can advance the analysis of the samples that you work with.