Presenter: Dalia Yablon, Ph.D., Owner, SurfaceChar

Which microscope should I use to image my materials? Materials characterization methods can often feel like an alphabet soup of three- and four-letter acronyms. There are many powerful methods available to explore all kinds of material properties: morphology, elemental information, chemical information, mechanical properties, and electrical properties. Dalia discusses three of the most popular microscopy-based methods that provide nanoscale information: scanning electron microscopy (SEM), transmission electron microscopy (TEM), and scanning probe microscopy/atomic force microscopy (SPM/AFM). During this webinar, Dalia compares and contrasts differences in capabilities, practical considerations such as sample prep and environment, and material information provided from each of these methods.

Thursday, February 7, 2019 at 1:00 p.m.

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