New Capabilities in Commercialized Atomic Force Microscopy (AFM)
October 17, 2019
Presenter: Dalia Yablon, Ph.D., Owner, SurfaceChar
One positive aspect of a field that is only 30 years old is that there is still a lot room and energy for the development of new capabilities. This webinar will review the new hardware and AFM modes that have been brought to market in 2019. On the mode side, this includes the new AFM-nDMA, which enables measurement of viscoelastic properties, such as storage modulus and loss tangent at 10nm spatial resolution. On the hardware side, we’ll discuss the introduction of a new large-sample instrument into the AFM market that combines high imaging speed and resolution with a novel photothermal actuation mechanism.