New Microscopy Offerings From Nikon Metrology

McCrone Microscopes & Accessories is excited to announce the release of the new Nikon MM-400N and MM-800N series measuring microscopes. These instruments provide excellent measurement accuracy for industrial in-line and quality assurance applications, and are ideal for inspecting, measuring and verifying 2D and 3D features across a wide range of components.

Nikon MM-400/800 Measuring Microscope
Nikon MM-800 Measuring Microscope.

Both the MM-400N and MM-800N are equipped with the following new features:

  • Aperture diaphragm control device on the diascopic illuminator which allows the analyst to adjust the aperture and optimize contrast and resolution. This enables the user to set the lighting conditions for measuring cylindrical products.
  • LED illuminators providing both white and green light sources allow the user to easily switch the light without inserting or removing filters. The high-intensity white LED illuminator has a constant color temperature and the light modulator responds quickly. Intensity is controlled from the instrument or via a PC interface using E-MAX software.
  • A wider range of measuring stages allows for a broader variety of diverse parts to be measured. Six robust stages are available for the MM-800N, ranging from 12” x 8” (300 mm x 200 mm) down to 2” x 2” (50 mm x 50 mm). The three smaller stages up to 6″ x 4″ (150 mm x 100 mm) are also compatible with the MM-400N.
One of the six available stages for the Nikon MM-800
One of the six available stages.
  • Environmentally-friendly power consumption — reduced by 10% compared to the
    former MM-400/MM-800 series models.
  • Enhanced height measurement is possible with the newly-developed split-prism type focusing aid. This enables more accurate focusing and reduces measurement errors caused by the depth of field of the objective lens.
Optional Focusing-Aid for Nikon MM-400/800
Optional Focusing-Aid (FA) Capability: Projected patterns enable accurate, repeatable focusing for excellent Z-axis measurement. Errors due to depth of focus variations are minimized and multiple operators achieve the same results.

We are happy to run a demonstration for you — contact us today to learn more about these new and exciting Nikon instruments.


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