More Than Topography: What Else Can Atomic Force Microscopy Measure?

September 15, 2017

Presenter: Dalia Yablon, Ph.D.

Atomic force microscopy (AFM) is probably most famous for the ability to create accurate three-dimensional surface maps with remarkable nanoscale resolution, but AFM is far more powerful than a mere mapping tool and can explore a wide variety of surface properties. Dalia provides an overview of the various properties AFM can measure—still all on the nanoscale and in conjunction with topography—including mechanical properties (adhesion, stiffness), magnetic properties, electrical properties (surface charge, conductivity), and optical properties, showing the unique versatility and power of this microscope. 41 minutes.

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