Using XPS for Industrial Problem Solving

May 6, 2017

Presenter: Kent Rhodes, Ph.D., SVP and Technical Director, McCrone Associates

Ever experience problems with adhesion, printing, passivation, delamination, or other issues with surfaces of products? Any time surfaces interact with other surfaces, or the environment, much of the interesting chemistry occurs in the outermost few atomic layers. Such thin layers can be difficult to analyze with common methods such as SEM, EDS, XRF, IR, chromatography, and bulk analysis techniques, but XPS is an electron spectroscopy method well-suited for these types of problems. The case studies presented show how XPS analysis may be used to investigate surface performance issues of industrial processes. 30 minutes.

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