Understanding Surface Properties Using XPS

April 4, 2019

Presenter: Douglas C. Meier, Ph.D., Senior Research Scientist, McCrone Associates

Chemical reactions between solids and their environment are governed by the identities and the chemical states of the molecules found on their surfaces. In order to predict how a material will react—or understand how it has reacted—to a given chemical environment, surface-sensitive analytical techniques must be utilized. One such technique is X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA). XPS exploits the nanometer-scale path length of electron photemission in solids to reveal information about a sample’s surface composition and chemistry. This free webinar provides a brief overview of the underlying theory of XPS and demonstrates a variety of analyses that can be performed using the technique, including compositional depth profiling and chemical state characterization, using our newly-acquired ThermoFisher Scientific NEXSA instrument.

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