XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications. Equipped with an in-house designed X-ray NanoFocus source and high precision manipulator, this industry-leading inspection system offers unrivalled feature recognition compared to any product available on the market today. As such, the XT V 160 NF is indispensable for any electronics development and production environment.
Do you require a quote before purchase? Are you a government agency or educational institution? Are you a customer outside of North America?Request Quote
Nanographia, our quarterly newsletter, brings you microscopy insights and information to apply in your workplace.
Call Us: 630.887.7100
Receive news, promotion, and event information from The McCrone Group.