Sub-micrometer and smaller sized samples are routinely isolated and prepared for analysis employing techniques we have developed. Isolation and separation of the contaminant from the bulk sample or substrate is essential in order to fully understand the nature of the defect. Whether it’s foreign particulate matter in a pharmaceutical vial or a microscopic stain on an electronics chip, our cleanroom microscopists can handle a wide variety of challenges.
Essentials of Polarized Light Microscopy and Ancillary Techniques by John Gustav Delly has been published.
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