McCrone Microscopes & Accessories Announces Agreement to be Licensed Dealer of JEOL NeoScope Benchtop Scanning Electron Microscope

McCrone Microscopes & Accessories Announces Agreement to be Licensed Dealer of JEOL NeoScope Benchtop Scanning Electron Microscope

WESTMONT, IL. (May 17, 2010) – McCrone Microscopes & Accessories announced today that it is now a licensed distributor of the JEOL NeoScope, a benchtop scanning electron microscope (SEM). McCrone Microscopes & Accessories is the instrument sales division of The McCrone Group, a world leader in materials analysis and microscopy.

The JEOL NeoScope is a compact, automated SEM designed for analysis of biological and material samples. Unlike other SEMs, commonly used settings are automated with the NeoScope, making the instrument simple to use without sacrificing image resolution. The NeoScope can be used to supplement optical microscopic analysis for a wide variety of applications, including pharmaceutical, geological and forensics studies.

“The NeoScope provides an extension of the optical microscope. Any laboratory performing optical microscopy examinations can benefit from in-house SEM analysis with this instrument, rather than sending samples to an external SEM lab,” said Jeff McGinn, Vice President and Director of Instrument Sales at McCrone Microscopes & Accessories.

The high resolution, large depth of field and automated settings (focus, brightness and contrast) make the unit easy-to-use and accessible to those in classroom settings or research laboratories, as well as novice or advanced SEM users. In addition, no special sample preparation is needed for conductive and non-conductive samples, further simplifying the process for the user.

On-site training, service contracts and a full line of SEM accessories for the NeoScope are available through McCrone Microscopes & Accessories.

For product and pricing information, visit www.mccronemicroscopes.com or www.benchtopsem.com.