Hitachi FlexSEM 1000 II Scanning Electron Microscope

The FlexSEM 1000 II VP-SEM combines innovative features with an intuitive interface to deliver flexibility in a powerful, automated, lab-friendly package. Cutting-edge technology provides unrivaled imaging performance, even in variable-pressure environments—a feature typically available in full-sized SEMs. This SEM is engineered for both novice and expert microscopists for a wide range of applications. From biological to advanced material specimens, this microscope will expand your analyses as well as your expectations.

The FlexSEM 1000 II Scanning Electron Microscope features new electron optics and signal detection capabilities. The system provides exceptional imaging and analytical performance. and its lab-friendly configuration can be installed in limited office, laboratory, or multi-use spaces.

Compact & High Performance Column
Best-in-class resolution in a compact system. The FlexSEM employs a newly designed electron optics with a reliability-proven high-sensitivity detector, achieving imaging at 4 nm.

Compact and High Performance Electron Optics
Equipped with a low-aberration objective lens, providing high resolution in a compact body.

New Generation Ultra Variable-pressure Detector (UVD-II)*
The UVD-II, a ultra variable-pressure detector with improved signal detection capability, provides a signal-to-noise ratio approximately 1.5 times higher than the previous-generation UVD.

Intuitive Operation
The user-friendly GUI provides fast and accurate Auto Focus Control (AFC) and Auto Brightness and Contrast Control (ABCC) algorithms. These functions execute in only 5 seconds to enable optimized imaging performance with minimal time and effort.

New & Improved Auto Functions
The user interface is easy to operate. With various automated functions, high-quality and quick data acquisition can be accomplished regardless of user experience. The system can be used with touch panel screen option.

Intuitive Sample Navigation
SEM MAP helps to locate regions of interest quickly, and delivers accurate correlated optical and SEM images using only one click.

Optical and EM correlation SEM MAP function is fully integrated into the GUI and allows for effortless navigation across the entire specimen. Navigate across your sample with the use of an optical camera, and deliver accurate correlated optical and SEM images using only a single click.

Advanced Imaging Capabilities
The newly developed electron optics and Ultra-Variable-Pressure Detector (UVD) enable superior imaging of specimen surfaces at low accelerating voltages and low vacuum conditions. The continous bias technology allows users to achieve high signal level at all accelerating voltages.

* Optional