The Scanning Electron Microscopy (SEM) training course emphasizes hands-on learning, using the latest SEM and EMA instruments. Students have the opportunity to study their own samples, or test samples provided by our experienced instructors.
During the scanning electron microscopy course, students learn through lecture, demonstration, and hands-on participation how to setup and operate SEM and EDS instruments, including low-vacuum and field-emission models. This SEM training provides a foundation for students new to SEM and EDS. At the end of the SEM workshop, students with no prior experience are able to align an SEM, obtain secondary electron (SE) and backscatter electron (BE) micrographs, and perform EDS qualitative and quantitative analysis. For students with prior experience, instructors emphasize techniques to identify particles and solve practical problems. The experience of our instructors helps students optimize SEM and EDS analysis for a wide range of materials analysis problems.
This course is part of our Industrial Microscopy Specialization.
See below for course outline and additional information.
“It was great to have three instructors for eight students... The small class size was great!” Centre of Forensic Sciences
“Instructors know the student’s level of expertise and were willing to stay past normal lecture hours. The review of certain materials was very helpful and the classroom environment was very relaxed.” New York City EPA
“The hands-on work was great. I liked having three instructors, each with unique experience.” Maryland State Police
“Because class sizes are kept small, it allows students to experience more hands-on time with the equipment and provides direct access to the instructors, who are extremely well-versed in their subject area. This combination makes it possible to successfully train students in complex subjects in a very short time.” Imperial Oil
Students are expected to successfully complete a variety of tasks in the form of hands-on exercises, laboratory exercises, identifications of unknowns, and quizzes. In addition, the students are required to have 100% attendance during the course, participate in class, complete a student evaluation form and pre and post course assessment forms.
The student is notified at the end of the course whether or not they have successfully completed the requirements of the course based on:
Upon successfully meeting these requirements, a student is awarded a certificate of completion and 3 CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or 3 CEU credits.
This course is part of the Industrial Microscopy Specialization program.
The program consists of attending four standard Hooke College of Applied Sciences (HCAS) courses with hands-on instruction and a 40 hour practicum study characterizing unknown samples.
After finishing the four courses, students complete a Capstone Project, which is a project that requires students to characterize and identify samples by integrating all of the skills learned during the four courses taken for the program. Those students who successfully complete the four courses and associated practicums, and a Capstone Project, earn an Industrial Microscopy Specialization.