Upcoming Dates

Are you interested in this course, but it is either not offered or not at a time that works with your schedule?

You will be contacted once this course becomes available.

Course Details

Course Outline
  1. Introduction and discussion of Scanning Electron Microscopy course and instrumentation.
  2. Discussion of student’s interest.
  3. Lecture on comparison of types of scanning electron microscopes.
  4. Lecture and practice on beam/specimen interaction, image formation, and image processing.
  5. Demonstration of Scanning Electron Microscopes.
  6. Demonstration and student participation on sample preparation, techniques, and equipment.
  7. Scanning Electron Microscopy lab exercises in imaging instrument setup and operation.
  8. Lecture and demonstrations on X-Ray analysis theory and detection, qualitative and quantitative EDS and linescans and mapping.
  9. Practice and participation of students on real-world samples.
Student Learning Resources
  • Detailed course manual
  • JEOL JSM-6480LV low vacuum SEM
  • JEOL JSM-6610LV low vacuum SEM 
  • JEOL NeoScope JCM-6000Plus

    All instrumentation, materials, and supplies necessary for successful completion of this course will be provided onsite by the Hooke College of Applied Sciences. 

What You Will Learn
  • Given SEM instrumentation setup and operation, as well as techniques in SEM sample preparation, capturing secondary and backscatter micrographs, and EDS qualitative and quantitative analysis, the student will set/up and operate a SEM, prepare materials for imaging and analysis, conduct analysis and interpretation, accomplishing all tasks successfully.
  • Given SEM (including low-vacuum and field-emission models), and EDS instruments, the student will setup (align) and operate the instruments successfully.
  • Given SEM sample preparation techniques and equipment, the student will mount samples appropriately for imaging and analysis.
  • Given SEM instrumentation, the student will acquire techniques in obtaining secondary electron and backscatter electron micrographs.
  • Given SEM and EDS instrumentation, the student will perform EDS qualitative and quantitative analysis.
Who Should Enroll
  • Students new to SEM and EDS
  • Students who would like to improve practical use and techniques
  • Electron microscopists
  • Materials scientists
  • Technicians
  • Instrument operators
What Students are Saying

“It was great to have three instructors for eight students... The small class size was great!” Centre of Forensic Sciences

“Instructors know the student’s level of expertise and were willing to stay past normal lecture hours. The review of certain materials was very helpful and the classroom environment was very relaxed.” New York City EPA

“The hands-on work was great. I liked having three instructors, each with unique experience.” Maryland State Police

“Because class sizes are kept small, it allows students to experience more hands-on time with the equipment and provides direct access to the instructors, who are extremely well-versed in their subject area. This combination makes it possible to successfully train students in complex subjects in a very short time.” Imperial Oil

Suggested Prerequisites
  • Prior use of SEM with EDS
  • Initial in-house or vendor training
Satisfactory Completion Requirements

Students are expected to successfully complete a variety of tasks in the form of hands-on exercises, laboratory exercises, identifications of unknowns, and quizzes. In addition, the students are required to have 100% attendance during the course, participate in class, complete a student evaluation form and pre and post course assessment forms.

The student is notified at the end of the course whether or not they have successfully completed the requirements of the course based on:

  • 100% Attendance
  • Class participation
  • Completion of all course material
  • Completed and signed student evaluation form

Upon successfully meeting these requirements, a student is awarded a certificate of completion and 3 CEU credits, if available. Those who have not successfully passed the course requirements do not receive a certificate or 3 CEU credits.

Industrial Microscopy Specialization

This course is part of the Industrial Microscopy Specialization program.

The program consists of attending four standard Hooke College of Applied Sciences (HCAS) courses with hands-on instruction and a 40 hour practicum study characterizing unknown samples.

  1. Polarized Light Microscopy
  2. Introduction to Scanning Electron Microscopy
  3. Sample Preparation: Particle Isolation and Handling Techniques
  4. FTIR Training

After finishing the four courses, students complete a Capstone Project, which is a project that requires students to characterize and identify samples by integrating all of the skills learned during the four courses taken for the program. Those students who successfully complete the four courses and associated practicums, and a Capstone Project, earn an Industrial Microscopy Specialization

We are here to answer your questions about this course.

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