Douglas C. Meier, Ph.D.
Instructor |Hooke College of Applied Sciences
Doug joined the electron optics group at McCrone Associates, Inc. in 2016. He currently specializes in X-ray microanalysis of particles using energy and wavelength dispersive spectrometry methods with the scanning electron microscope and electron microprobe. Doug began his career as a physical chemist and surface scientist, developing capabilities and expertise in surface-sensitive spectroscopies such as Auger electron spectroscopy, X-ray photoelectron spectroscopy, infrared reflection-absorption spectroscopy, thermal desorption spectroscopy, and low-energy electron diffraction. He later was awarded a National Research Council postdoctoral research associateship with the Process Sensing Group of the National Institute of Standards and Technology where he was able to apply these skills to the development of conductometric chemical microsensor array technology, demonstrating the ability to detect and identify chemical warfare agents, toxic industrial chemicals, and volatile organic compounds at concentrations in air lower than one part per million. For this work, Doug was awarded the U.S. Department of Commerce Silver Medal. Doug segued into standards and metrology development for microanalytical techniques such as Auger microscopy, wavelength dispersive spectrometry, and transmission electron microscopy, building ten years of microbeam analysis experience prior to joining McCrone Associates, Inc.
Ph.D., Chemistry, Texas A&M University, 2001
B.A., Chemistry, Northwestern University, 1996
Meier, D. C. and Cavicchi, R. E., “Forming spherical gold nanoparticles from polymorphic nanoparticles using a single laser pulse,” J. Nanopart. Res. 16 (2014) 2460.
Meier, D. C., Davis, J. M., and Vicenzi, E. P. “An examination of kernite (Na2B4O6(OH)2 • 3 H2O) using X-ray and electron spectroscopies: quantitative microanalysis of a hydrated low-Z mineral,” Microsc. Microanal. 17 (2011) 718.
Eustis, S., Meier, D.C., Beversluis, M., and Nikoobakht, B. “Analysis of copper incorporation into ZnO nanowires,” ACS Nano 2 (2008) 368.
ISO/TC 202/SC 1 Secretary – Microbeam analysis terminology
ASTM International E42.03 (AES and XPS) and E54.01 (CBRNE detectors)
American Chemical Society