Thursday, July 19, 2018 • 1:00 p.m.
Presenter: Dalia Yablon, Ph.D.
Since its invention 30 years ago, the field of AFM has proliferated into dozens of techniques comprising an alphabet soup of three- or four-letter acronyms, but there is still a core group of techniques that are the most popular methods to measure key fundamental properties such as topography, modulus, adhesion, magnetic interactions, and electrical interactions. Dalia will go over six of the common AFM methods used today to explore important surface properties on the nanoscale.
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Essentials of Polarized Light Microscopy and Ancillary Techniques by John Gustav Delly has been published.
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