Thursday, February 2, 2017 • 1:00 p.m.
Presented by Dalia Yablon, Ph.D.
Adjunct Instructor for Hooke College of Applied Sciences
Atomic force microscopy (AFM) is uniquely suited to characterize polymer materials on the nanoscale revealing structures and morphology without the need for extensive sample prep or vacuum environment.
Unlike its electron microscopy counterparts, the interaction between probe and sample in AFM is mechanical-based making it especially suited to provide contrast on polymeric type samples. We will review application of AFM to study different polymer materials including thermoplastics, elastomers, blends, and high resolution studies.
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As we celebrate our 60th anniversary, we thank you for entrusting us with more than 60,000 of your materials analysis projects.
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