X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a surface analysis technique that uses characteristic photoelectrons generated by an X-ray beam to analyze the composition and chemistry of the outermost ~5 nm (<50 atoms thick) of the surfaces of solid samples.
Using XPS, we can determine the quantitative elemental composition of surfaces and the chemical states of surface atoms. This information can aid in the identification of molecular species present on surfaces as well as characterize chemical interactions between a sample and its environment. Combining XPS with ion-beam depth profiling is a particularly useful method for precisely determining the thickness and composition of multi-layered microstructures, such as electronic devices, plated metals, and solar cells.
McCrone Associates uses a ThermoFisher Scientific Nexsa X-Ray Photoelectron Spectrometer, a dedicated XPS system with many advanced features, including:
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