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Microscopy Training ›Courses ›Scanning Electron Microscopy, Online Course

Scanning Electron Microscopy, Online Course

Course Details

Students with no prior experience will learn to align an SEM, obtain secondary electron (SE) and backscatter electron (BE) micrographs, and perform EDS qualitative and quantitative analysis. For students with prior experience, instructors Craig S. Schwandt, Ph.D., and Douglas C. Meier, Ph.D. emphasize techniques to identify particles and optimize SEM and EDS analysis for a wide range of materials analysis problems.

During this online, on-demand scanning electron microscopy course, you’ll learn:

  • Instrument Basics
    • Vacuum
    • Emitter
    • Column
    • Detectors
  • Image Acquisition
    • Alignment
    • Parameters
  • Quantitative Mapping
  • Quantitative Analysis

 

Here are comments we’ve received from students who have completed the online SEM course:

“This was a wonderful course. I had read an in-depth book on SEM and EDS but this was organized much better than the book and helped me to organize my thoughts as well. Thanks!”

“It was a series of great presentations. The instructors were thorough with their presentations and explained the content in the most comprehensible way. I really enjoyed the course. Thank you.”

“I have already used what I have learned to greatly improve my SEM images.”

Accreditations

Hooke College of Applied Sciences, LLC is approved to operate by the Private Business and Vocational Schools Division of Illinois Board of Higher Education.

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