Locard Honored with Postage Stamp
In Lyon, on 14 April 2016, France issued a 0.70€ postage stamp honoring Edmond Locard (1877-1966). In addition to a portrait of Locard, the stamp… Read More
Automated Particle Analysis
Automated particle analysis (APA) using scanning electron microscopy (SEM) and energy-dispersive x-ray spectrometry (EDS) is a method used to analyze large numbers of… Read More
March Madness at Hooke College of Applied Sciences
Hooke College of Applied Sciences, a member of The McCrone Group, completed another successful course in Scanning Electron Microscopy (SEM). Ten students from academia,… Read More
Identifying Foreign Particulate in Pharmaceutical Products
Presenter: Scott F. Stoeffler, Senior Research Microscopist, McCrone Associates An integrated approach to particle identification aids in… Read More
So, You Think You Are a Scanning Electron Microscopist?
Presenter: Joe Rebstock Are you a knob tweaker or a knowledgeable operator? During this webinar, you will learn how to make informed decisions when setting… Read More
Visiting Professor Brings Microscopy to Your Science (and Arts) Curriculum
The addition of core concepts related to engineering, technology, and applications of science to other areas of study, such as manufacturing, are the essence of… Read More
New Year, New Products, New Solutions
Every year, companies release new products, often highlighting them as “new and improved.” Improvements are nice, but innovation is better! As The McCrone Group celebrates… Read More
NeoScope vs. Full-Sized SEM
Presenters: Craig S. Schwandt, Ph.D., Director of Industrial Services and Senior Research Scientist, McCrone Associates, and Alan… Read More
Evaluation of Microscopic Analytical Techniques for the Analysis of Artists’ Materials
Abstract My senior thesis utilized samples from a painting to determine which instrumental techniques are most appropriate and effective for the identification of artists’ materials. Read More
SEM/EDS Analysis for Problem Solving in the Food Industry
Abstract For forensic investigation in the food industry, scanning electron microscopy (SEM) in conjunction with energy dispersive X-ray spectrometry (EDS) is a powerful, often non-destructive,… Read More
